A low-temperature dynamic mode scanning force microscope operating in high magnetic fields
نویسندگان
چکیده
منابع مشابه
Design of a variable temperature scanning force microscope.
We have developed the variable temperature scanning force microscope capable of performing both magnetic resonance force microscopy (MRFM) and magnetic force microscopy (MFM) measurements in the temperature range between 5 and 300 K. Modular design, large scanning area, and interferometric detection of the cantilever deflection make it a sensitive, easy to operate, and reliable instrument suita...
متن کاملLow temperature behavior of magnetic domains observed using a magnetic force microscope
A commercial atomic force microscope/magnetic force microscope ~MFM! was modified to cool magnetic samples down to around 100 K under a high vacuum while maintaining its routine imaging functionality. MFM images of a 120 nm thick La0.7Ca0.3MnO3 film on a LaAlO3 substrate at low temperature show the paramagnetic-to-ferromagnetic phase transition. Evolution of magnetic domains and magnetic ripple...
متن کاملThe ReactorAFM: non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions.
An Atomic Force Microscope (AFM) has been integrated in a miniature high-pressure flow reactor for in-situ observations of heterogeneous catalytic reactions under conditions similar to those of industrial processes. The AFM can image model catalysts such as those consisting of metal nanoparticles on flat oxide supports in a gas atmosphere up to 6 bar and at a temperature up to 600 K, while the ...
متن کاملDynamic nuclear polarization in a magnetic resonance force microscope experiment.
We report achieving enhanced nuclear magnetization in a magnetic resonance force microscope experiment at 0.6 tesla and 4.2 kelvin using the dynamic nuclear polarization (DNP) effect. In our experiments a microwire coplanar waveguide delivered radiowaves to excite nuclear spins and microwaves to excite electron spins in a 250 nm thick nitroxide-doped polystyrene sample. Both electron and proton...
متن کاملA high performance scanning force microscope head design
Since its inception in 1985, the atomic force microscope’ [also known as the scanning force microscope (SFM)] has held great promise for imaging nonconducting samples with subnanometer resolution. Early attempts to image relatively inelastic samples such as graphite, crystals of ionic salts, and semiconductors yielded atomic resolution data. These data provided reason to believe that SFM might ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1999
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1149842